Cross-Layer Design for Reliability in Advanced Technology Nodes: An EDA Perspective

Design for reliability (DFR) in advanced technology nodes has become an increasingly challenging task, which requires comprehensive support from aging-aware EDA tools and optimization design flows. In this paper, our recent studies on the cross-layer aging-aware design are summarized, especially from EDA perspectives. The recent advances in reliability modeling device-level, a set of aging-aware modeling and analysis frameworks at the circuit level and system level are overviewed. The results demonstrate that the cross-layer DFR framework enables an accurate analysis to reduce over-design and optimize PPA across lifetime, and can help designers to explore error-resilient architecture more efficiently.