Reliability Evaluation of Superluminescent Diodes in Space Environment Based on Bayesian Networks

Reliability evaluation of electronic systems in space environment is a critical issue. In this work, reliability evaluation of superluminescent diode (SLD) systems, which are sensitive to both displacement damage effects and charge–discharge effects, was investigated by the Bayesian network model. Displacement equivalence model of the SLDs is verified by the irradiation results of 5-MeV protons and 1-MeV electrons. Charge–discharge effects of SLDs are induced by 110-keV electrons. Orbital energy spectra and cumulative distribution functions for the equivalent irradiation fluence are calculated by self-built software. Based on the experimental and calculated results, the Bayesian networks under various conditions are established. The probabilities of the type of faults prone in the system under each condition can then be analyzed and quantified. The proposed method provides a good idea for on-orbit reliability evaluation of complex systems.