Modular Dynamic Characterization Bench for Wide Bandgap Power Semiconductors

The double pulse test (DPT) is a widely accepted method to measure the switching performance of power semiconductor devices. This technique usually requires an iterative and lengthy process for developing custom circuitry for each individual semiconductor device evaluated. This paper presents the design of a generalized and modular DPT characterization testbed. This testbed supports the characterization of a wide variety of semiconductor technologies with different packages and power ratings, with minimal effort required to accommodate new devices.