MCU+ Test Solution on V93000 SMARTTEST8

With the development of semiconductor technology, MCU is becoming more and more integrated. The traditional MCU includes processor module, memory module, IO module, power gain amplifier module and other analog modules. However, with the development of IOT technology, many new MCU integrates ADC, DAC and Bluetooth communication modules, this type of MCU is referred to MCU+ in this article. MCU+ test integrates digital test, dc test, analog test, RF test compared with traditional MCU test only requiring digital test and dc test. This paper introduces the test solution of MCU+ chip based on V93K platform, including the hardware of Wave Scale series and the software solution of the new generation platform SmartTest8. Meanwhile, this paper designed a set of MCU+ test program library based on SmartTest8 API, which includes the common function of dc action, analog waveform generator action, digitizer action, rfStim action, rfMeas action. It can help users improve the test program development efficiency by more than 30% and improve the quality of test program development and reduce the maintenance cost.