Reconfigurable and Parameterizable Pseudorandom Pattern Generators for Built-in Self Test

A Linear Feedback Shift Register (LFSR) is a shift register whose input bit is the linear function of its previous state. This circuit can generate pseudo random sequences of bits which can be used in cryptographic applications as well as testing logic circuits. Built-In Self-Test (BIST) is a structured method of including self-testing ability in an IC. Test Pattern Generator (TPG), one of the major components in BIST supplies the required test patterns. The quality of testing is decided by the number of faults detected by the test patterns used. In this work, a reconfigurable and parameterizable pseudorandom pattern generator based on different configurations of LFSR is proposed. The circuit is able to generate test patterns corresponding to any degree of primitive polynomial and can be configured to work as any type of pseudorandom sequence generator internal, external, complete or reseeding LFSR The designing and verification are done in Xilinx Vivado.