LED LIFE ASSESSMENT BY ACCELERATED TEST METHODS - A REVIEW

In the modern grid different types of voltage disturbances in the power supply are expected due to the integration of renewable energy sources and electric vehicles. These voltage disturbances affect the luminaires lifetime and may lead to light flicker and catastrophic failures of light emitting diode (LED) lamps. Therefore, more scientific and practical accelerated testing methods for detecting catastrophic failure rates are required. Presently there are no standard procedures existing for accelerated test methods to predict catastrophic failure. This paper attempts to understand the intricacies of failure, lifetime, and reliability for evaluating LED products. Further the paper contains a literature search and summarizes the existing testing techniques and finally present recommendations for estimating catastrophic failure according to modern grid conditions.