Research On Embedded Integrated Circuit Test System

Integrated circuit testing is a key technology in the development of integrated circuit industry and an important means to analyze whether there are defects in integrated circuits. With the continuous improvement of the integration of IC devices, the number of chip pins is also increasing, and the test speed is becoming higher and higher. The previous pin by pin test can not adapt to the rapid development of IC, and the simultaneous measurement of multiple pins and multiple stations has become the basic function of the test system. At the same time, for large-scale IC testing, it is necessary to develop more high-speed, low power consumption, multi-channel effective testing scheme. In this paper, an integrated circuit test scheme based on embedded system is proposed. The method takes STM32 as the control module of the test system and combines AD5522 and AD7685 hardware circuits to design and implement the INTEGRATED circuit DC parameter test system. In the design, THE SPI interface of AD5522 is used for data transmission, and the measurement can be completed through the 29-bit control word to control the internal register of the chip, which can complete the measurement mode of driving voltage measurement current and driving current measurement voltage, and combined with the internal calibration of the chip and external software calibration to reduce the measurement error. The experimental results show that the system has the characteristics of compact structure, fast speed, high precision and strong applicability.