Methods for Improving the Reliability of Intelligent Semiconductor

Intelligent semiconductors adopted in safety-critical systems such as autonomous vehicles and medical devices require high reliability. It is necessary to analyze soft-errors that may occur in semiconductors due to cosmic ray strikes. For the reliability analysis, a method such as architectural vulnerability factor analysis that quantifies the weak parts of the system was proposed. In addition, a fault injection test was used to explore system vulnerabilities by artificially generated soft-errors. In this paper, we describe methods for improving the reliability proposed above and the advantages and disadvantages of each.