Uncertainty Analysis in the Inverse of Equivalent Conductance Method for Dealing With Crosstalk in 2-D Resistive Sensor Arrays

2-D resistive sensor arrays (RSAs) appear in many applications to measure physical quantities in a surface. However, they suffer from a crosstalk problem when the simplest configuration is used to address a row-column. Thus, the value of a single cell cannot be measured directly. Several hardware solutions have been proposed to solve it totally or partially but all of them make the circuit more complex. In a previous paper we proposed an innovative numerical solution to eliminate crosstalk after a complete scan of the matrix, which is named in this paper as Inverse of Equivalent Conductance Method (IECM). In the current study, we have analyzed the implications of the method for the uncertainty of the calculated cell resistance by first deriving the sensitivity of the solution and then applying uncertainty propagation theory. The theoretical results have been tested in simulated arrays and in a real
$6 \times 6$
RSA with known values of resistances with good agreement. The uncertainty analysis is able to predict which values are reliable. In general, the lowest resistances of the array are better solved by IECM as expected. In addition, it is also shown that IECM has the potential to be adapted to other hardware configurations that reduce crosstalk, helping to overcome some of its limitations.