Binary Coded Genetic Algorithm Application for Array Diagnosis

Retrieving the excitation distribution can find defective elements to complete the task of array diagnosis. This paper presents an array diagnosis method based on the binary coded genetic algorithm (BCGA), where a cost function defining the error between the degraded array pattern and the estimated array pattern is minimized by BCGA to obtain the excitation of each element. BCGA is much faster than the conventional genetic algorithm (GA) in finding faulty elements. An example of a planar array diagnosis is conducted to show the capability of the proposed method.