Abstract:
In LSI testing, equivalent time sampling techniques are frequently used because the input signals to the device under test and the sampling clock are controllable; when t...Show MoreMetadata
Abstract:
In LSI testing, equivalent time sampling techniques are frequently used because the input signals to the device under test and the sampling clock are controllable; when the repetitive input signals are applied to the analog device under test, its output signals can be also repetitive. In this paper, we investigate an efficient waveform acquisition method with the equivalent-sampling using the metallic ratio of the sampling frequency and the input frequency, which is expected to be used for on-line, short-time and simple analog/RF/mixed-signal IC testing.
Published in: 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS)
Date of Conference: 28-30 June 2021
Date Added to IEEE Xplore: 26 July 2021
ISBN Information: