Dispersive vs charge-sensing readout for linear quantum registers

We present recent progress in the implementation of scalable schemes for spin qubit readout in one dimensional quantum registers based on fully-depleted silicon-on-insulator (FDSOI) technology. We compare two schemes both based on rf gate reflectometry. The first one, denoted as dispersive readout, minimizes the device overhead thereby facilitating scale-up to large qubit registers. The second one, denoted as charge-sensing readout, requires additional readout components but is less sensitive to the strength of the interdot coupling facilitating operation in the few-electron regime. We demonstrate single-shot charge sensing with a fidelity of 97% in 5 μs. Finally, we propose a scalable device architecture for linear qubit registers relying on charge-sensing readout.