Application of wavelet transform in I-V characteristic test of photoelectric sensor

The I-V characteristic test of photoelectric sensor will inevitably be interfered by the noise signal, especially when the output signal is weak. In order to improve the accuracy of I-V test, wavelet transform is selected to process the output signal of photoelectric sensor based on the analysis of noise characteristics in I-V characteristic test. The appropriate wavelet basis function and decomposition layers are determined by simulation experiments. The results show that wavelet transform can effectively eliminate the noise in the signal, obviously improve the accuracy of the characteristics I-V test.