Quantifying the Window of Uncertainty for SSTDR Measurements of a Photovoltaic System

Spread spectrum time domain reflectometry (SSTDR) is a non-intrusive method for electrical fault detection and localization that enables continuous monitoring of live electrical systems. Electrical faults create changes in impedance that create subsequent changes in the SSTDR reflection response. These changes in reflection response can be detected only if the changes are outside the window of uncertainty of the SSTDR measurement. In this paper, we establish a method of determining this window of uncertainty and the associated minimum-detectable change in impedance for SSTDR measurements. We demonstrate this for a photovoltaic (PV) systems, although the methods could be similarly applied to other applications. We assess the variability in SSTDR measurements caused by changes in the PV system that are representative of normal maintenance actions such as disconnecting/reconnecting a connector and completely breaking-down/setting-up the entire system. We evaluate how this variability translates to a minimum-detectable change in impedance and how that relates to common faults in PV systems (arc and ground faults, shading, damaged cells, and aging). We also describe methods of increasing SSTDR fidelity to accurately extract minor changes in impedance and therefore, detect small-magnitude electrical faults.