Design of a Dynamic Parameter-Controlled Chaotic-PRNG in a 65 nm CMOS process

In this paper, we present the design of a new chaotic map circuit with a 65 nm CMOS process. This chaotic map circuit uses a dynamic parameter-control topology and generates a wide chaotic range. We propose two designs of dynamic parameter-controlled chaotic map (DPCCM)-based pseudo-random number generators (PRNG). The randomness of the generated sequence is verified using three different statistical tests, namely, NIST SP 800-22 test, FIPS PUB 140-2 test, and Diehard test. Our first design offers a throughput of 200 MS/s with an on-chip area of 0.024 mm
²
and a power consumption of 2.33 mW. The throughput of our second design is 300 MS/s with an area consumption of 0.132 mm
²
and power consumption of 2.14 mW. The wider chaotic range and lower-overhead, offered by our designs, can be highly suitable for various applications such as, logic obfuscation, chaos-based cryptography, re-configurable random number generation, and hard-ware security for resource-constrained edge devices like IoT.