Graded Index Dielectric Superstrate for Phased Array Scan Compensation

This paper presents the use of additively manufactured graded index materials to improve the scan impedance variation of phased arrays. Solvent-based extrusion permits the programmatically controlled printing of chosen material properties with relative permittivity ranging from 2 to 24.5. This low-loss material shows promise for improvement of scan impedance variation for high scan angles in a smaller footprint than discrete layers.