Analysis of Fault Precursor Parameters Under Accelerated Aging Tests for IGBT Modules

Accelerated aging test is an important means to figure out the failure and degradation law of power electronic devices. By studying the external characteristics of IGBT module electrical parameters, the health status and degradation mode of IGBT module can be monitored and predicted. This paper uses static and dynamic electrical parameters of IGBT devices as fault precursory parameters and analyses the degradation laws of in accelerated aging tests. In order to get a better understanding of the the degradation law and aging prediction of IGBT, this paper analyses the aging mechanism and physical phenomena of fault precursory parameters of IGBT under various tests. The content of this paper lays a foundation for the establishment and research of accelerated aging test model, and has positive significance for reliable operation and life prediction of equipment.