Minimizing of back-scattering using composite double layer structure of different patch configurations

The paper presents the analysis of plane wave scattering from composite double layer structures of different electrical parameters. The structure comprises dielectric and chiral layers and both are loaded by arrays of patches of different geometries. The reflection characteristics are analyzed for different loading configurations. The analysis is based on the generalized scattering matrix (GSM). The scattering matrix of each layer is obtained by solving the BC problem on the conductor at the interface of each layer using the conjugate gradient iteration scheme in conjunction with the fast Fourier transform (CG-FFT). All of the scattered propagated modes are studied. The results illustrate that the proposed structure with different patch configurations achieves better absorption characteristics than the use of square patches.