Method for critical current testing: software corrections

A digital method for accumulating critical current date allows the test to be automated. Digital techniques provide the opportunity to make corrections for self field, protection shunt, and transient voltages which are not feasible with an analog system. Automation also allows rapid data analysis to inspect the test for bad data. The digital current incrementing method deviates from the ASTM test method, but the authors' measurements on the NbTi SRM and the Japan-US B sample from round robin testing show it to be accurate to within the limits set by ASTM.<>