Phenomenological model for the microwave surface resistance of the high temperature superconductors

This paper presents a simple empirical model based on the two fluid model that explains the occurrence of anomalous low temperature microwave resistive peaks in high temperature superconductors. One of the key features is the presence of impurities in the sample, which affect the magnitude and position of the surface resistance peak resulting in different power losses at different impurity levels. Thus the appropriate doping concentration can control these power losses.