Impact of Local Back-Surface-Field Thickness on Open-Circuit Voltage in PERC Solar Cells: An Experimental Study Applying ANOVA to Determine Critical Sample Size Necessary to Differentiate Mean LBSF Values With Statistical Significance

Sufficiently deep local back-surface-fields (LBSF) are crucial for achieving low contact recombination and thus high solar cell efficiencies in passivated emitter and rear contact (PERC) solar cells. In this article, we investigate spatial variations of LBSF thickness 1) across dashed contacts, 2) between lateral positions within a cell, and 3) from cell to cell. The objective of this experimental study is to proof the impact of LBSF thickness on open-circuit voltage in PERC solar cells. Our measurements and analysis of variance (ANOVA) reveal that variations in LBSF thickness across dashed contacts exceed observed variations in LBSF thickness between lateral positions within a cell as well as cell-to-cell variations. Thus, we statistically treat all LBSF measurements of a single experimental group of PERC solar cells as one population of measurements. The two investigated experimental sets of PERC cells fired using different fast-firing profiles show a difference in LBSF thickness of about 1 μm. The resulting difference in open-circuit voltages arises to 1.3 mV. ANOVA-based analysis shows for our experimental samples that at least 19 random measurements are necessary in order to resolve LBSF thickness difference of 0.5 μm with sufficient statistical significance.