Nonlinear Dynamic Analysis of Non-Contact Atomic Force Microscope

This work aims to construct a mathematical model to investigate the dynamical behavior of cantilever of the atomic force microscope in the non-contact working state. To create the model of the cantilever lumped parameter model is utilized. In this work, to model the tip-sample interaction force we use the Van der Waals force. This external force makes the system nonlinear. To solve the system, and obtaining the frequency response equation, the Van der Pol averaging method is utilized. The effect of the non-linearity, the excitation amplitude, and the damping coefficient on the frequency response equation of the system are studied.