Contacts on single crystals grown by liquid phase epitaxy

We have fabricated a contact with a small area on a YBa/sub 2/Cu/sub 3/O/sub 7-y/ (YBCO) ground plane grown by Liquid Phase Epitaxy (LPE). The contact has a ramped edge structure, which directly connects CuO/sub 2/ planes between the ground plane and lines. After deposition of NdBa/sub 2/Cu/sub 3/O/sub 7-x/ (NBCO) films used for lines, no deterioration is observed in AFM image on the ramped edge in spite of its higher deposition temperature than that of the YBCO thin film. This shows high crystal quality of the YBCO film grown by LPE. Flux flow type current-voltage characteristics are observed with critical current density of 5/spl times/10/sup 4/ A/cm/sup 2/ at 47 K. XRD shows strain caused by lattice mismatch along the boundaries between NBCO and YBCO.