Storage Based Built-In Test Pattern Generation Method for Close-to-Functional Broadside Tests

Built-in self-test (BIST) eliminates the need for an expensive tester, and reduces the security vulnerabilities of scan design. This paper describes a BIST approach that combines the following features. (1) It is based on storage of test data on-chip to achieve complete fault coverage. (2) Every entry of the stored test data is used for applying several different tests to reduce the amount of stored test data. (3) The test data is derived from functional broadside tests, and the applied tests maintain close-to-functional operation conditions to avoid overtesting of delay faults. Experimental results are presented for benchmark circuits to demonstrate the effectiveness of this approach.