Statistical verification of relation between L.F. and H.F. noise level of bipolar transistors

In this paper, statistical investigations of the relationship between L.F. noise and H.F. noise of type BF200 bipolar transistors are described. 1/f noise is the main kind of low frequency noise in semiconductors and semiconductor devices. The results of comparative measurements of the low frequency noise in selected bipolar transistors, designated to work in different frequency ranges, are also presented.