Time-Domain Reflectometry for Measuring Scattering Parameters: Comparison of M-sequence Device and Step-generator TDR

Scattering parameters of microwave networks and antennas could be measured in time domain to lower the measurement cost and time. Although time-domain data may include some errors and inaccuracies, they can be compensated by proper measurement systems and processing. In this study, we examined a comprehensive method for two measurement devices, a step-generator time-domain reflectometer and a maximum length sequence (M-sequence) sensor. The resulting scattering parameters are compared with frequency domain results measured with a vector network analyzer (VNA). Both measurements are in agreement with the frequency domain results, however, considering the effect of random errors in two devices, maximum length sequence shows significantly accurate results according to its lower jitter.