An Efficient Scan Chain Diagnosis for Stuck-at and Transition Faults

Scan-based test and diagnosis are important for improving yield of nanometer-scale chips. However, the scan chain can be subject to defects due to large hardware incurred by itself, which accounts for considerable portion of total chip area. Hence, scan chain test and diagnosis has played a critical role in recent years. In this paper, an efficient scan chain diagnosis method is proposed for not only stuck-at fault but also transition fault. The proposed method is implemented simply and provides maximum diagnosis resolution for stuck-at and transition faults.