Numerical Parameter Extraction for Multi Terminal Type Microwave Devices

A new method for the determination of the scattering parameters of microwave components with heterogeneous terminals is presented. The method is based on the widely known TRL calibration scheme. Applying a two tier calibration, the abstract error boxes determined during the TRL procedure are converted into physical objects. This makes it possible to measure microwave structures with different port types. The one degree of freedom uncertainty of the error boxes, which is inherent to the TRL calibration procedure, is removed by the assumption that these boxes represent reciprocal devices. This is the case in most practical applications. The function of the procedure is proven with another measurement method for vector network analyzer measurements.