The statistical distribution of percolation resistance as a probe into the mechanics of ultra-thin oxide breakdown

Soft and hard breakdown result from the statistical distribution of the percolation conductance, rather than any physical difference between the traps involved. The distribution obtained confirms some subtle and surprising predictions of the percolation model and shows that the effective trap-diameter is less than 1.5 nm. It also demonstrates that 1.5 nm oxides at 1 V can not undergo hard breakdown.