Lightweight Integrated Design of PUF and TRNG Security Primitives Based on eFlash Memory in 55-nm CMOS

We present a lightweight, suitable for Internet of Things (IoT) devices, integrated design of physically unclonable function (PUF) and true random number generator (TRNG) based on embedded flash memory in 55nm CMOS. In the proposed approach, the randomness in nonlinear I-V characteristics and temporal current fluctuations of embedded flash memories are exploited to generate the dynamic and static entropies. Shared silicon in designing PUF and TRNG results in a very compact and energy-efficient topology. Experimental and simulation results demonstrate >10200 key space, 0.58-pJ/b energy efficiency for <; 5% controllable bit error rate at 80 °C, up to 192.3-Mbps throughput, high Shannon entropy, and resiliency toward machine learning attacks. Accelerated aging measurements indicate stable physical unclonable function response after 900 min of baking at 85 °C.