Processing of image in optical and X-ray radiartion range by the sensor based on nonideal heterojunction

It is known that the sensor element based on the non-ideal CdS-Cu2S heterostructure is sensitive to optical and X-ray radiation. Such a sensor can accumulate and store optical and X-ray images. The sensor has a linear dependence of the signal on the dose of incident x-ray radiation. A novel technique has been developed to eliminate the influence of the surface inhomogeneity of the sensor sensitivity on the quality of the resulting image. This technique is based on the processing of the resulting image, taking into account additional information about the sensitivity of the sensor to optical and X-ray radiation at each surface point.