Robustness Testing of EEPROM Emulated Flash for Automotive Microcontrollers

Memory module in any automotive microcontroller is of crucial importance as it stores fast changing data of ECUs and stores important information about the Car, To ensure that the flash memory is robust and can be deployed in the field production, a framework is developed to test the Robustness of FEE. The test setup simulates all possible conditions where information stored in Flash memory can be compromised. This paper aims to detect the faults in Flash Driver programming, by running the code in hardware. This setup can be used to test and increase the Robustness of FEE module in Automotive Micro-controllers.