Characterization of X-Band Wave Absorber Made of SRR-Based Metasurface

Researches on electromagnetics wave absorber implemented with common pattern structures have been explored for many applications. One of fundamental issues is its insufficiency in the performance, particularly bandwidth response and absorption characteristic. This paper presents the characterization of X-band wave absorber made of metasurface based on split-ring resonator (SRR). The utilization of SRR-based metasurface in the development of X-band wave absorber is intended to enhance its bandwidth response and absorption characteristic. The structure of X-band wave absorber is designed using a unit cell of metasurface composed of an SRR and a narrow thin strip implemented on different layers of 0.8 mm thick FR4 epoxy dielectric substrate. By taking the unit cell dimension of 3.80 mm × 3.80 mm, the characterization of proposed X-band wave absorber is performed. The characterization result shows that the separation of SRR in a unit cell holds an important role in achieving the desired performance of X-band wave absorber.