Radar Based Material Characterization at 145 GHz Utilizing an Ellipsoidal Reflector

This contribution presents a method for the characterization of thin dielectric materials based on frequency modulated continuous wave (FMCW) radar. The transceiver allows precise measurements in the frequency range between 122 GHz and 169 GHz. Using an elliptical mirror, the radiation is focused on the material, achieving a small beam diameter and plane wave fronts. The time domain material measurements are evaluated by means of Matching Pursuit Decomposition (MPD). Thus, the dielectric properties as well as the layer thickness can be determined.