On orbit screening and positioning chip technology for single event effect of spacecraft

Electronic systems tend to observe single event upsets (SEUs) when exposed to radiation environments in space. In order to detect and position these errors in on-orbit systems such as Field-programmable gate array (FPGA) and System on chip (SoC), we present a novel independent SEU detector which can be placed anywhere on the printed circuit board (PCB). By utilizing both the column single event effect (SEE) current sensor and the row SEE current sensor in the system, the location of high-energy particles can be precisely located with the accuracy better than 50 μm. By changing the clock frequency, we can greatly improve the time resolution of monitoring high energy particles. Combined with the counting position of particles, the incident rate of space high-energy particles can be obtained. By changing the critical charge of SEE current sensor or the width of depletion layer, the LET value of high-energy particle in the incident space can be effectively improved, and the resolution of linear energy transfer (LET) value can reach 1MeV*cm²/mg. we are able to obtain such information as incident position, incident time, fluence, flux and LET value of high-energy particles.