Random GaAs IC's ESD failures caused by RF test handler

This paper describes a case study of GaAs IC ESD failures caused in a RF test handler. The test handler caused yield problems compared with another tester. A small insulator inside the test fixture assembly was found to generate up to 200 volt ESD pulses, causing sporadic device failures. This problem was resolved by replacing the insulator with a piece of static dissipative material. In this paper, we present tester investigation and evaluation, material investigation, experimental results, and conclusions from production follow-up.