Embedded ADC testing challenges: proposals from research

Analog-to-Digital Converters (ADCs) are essential mixed signal components in System-on-Chips (SoCs). However, testing an embedded ADC is becoming challenging and expensive, thus it pushes the research community to find suitable solutions. The paper, after an explanation of the challenges in the embedded ADC testing, presents an overview of the most recent proposals surveyed from scientific literature in the field to overcome current problems and limitations.