Software and Hardware Complex for Study of Photoelectric Properties of Semiconductor Structures

The method of measurement of electrical conductivity, photoconductivity and photomemory of semiconducting films, as well as electrical characteristics of photovoltaic cells of generators have been described. An electric circuit based on a 32-bit microcontroller is presented and a computer program is developed that provides automation of measurements, registration and initial processing of data, the possibility of constructing graphs of time and temperature dependencies for preliminary analysis of experimental data already in the process of measurement.