Experimental characterization of switching noise and signal integrity in deep submicron integrated circuits

The paper describes a strategy for characterization of on-chip EMC behaviour. The focus lies on electromagnetic emission (EMC), which is the most important part for microcontrollers with a 5 V supply. A reliable testchip strategy is presented. From the evaluation of those testchips, silicon circuits for EME reduction have been identified which were then implemented in microcontroller productive steps. An overview of valuable design measures is given as well as the system aspects of EMC on chiplevel and the next steps which have been started to support "chip design for EMC" before production. The benefit for application designers are pointed out.