Guest Editorial Robust System Design: IEEE International On-Line Testing and Robust System Design Symposium (IOLTS) 2018

You are reading the Editorial of the Special Section of IEEE Transactions on Device and Materials Reliability (TDMR) with a collection of the best papers of the 2018 edition of the IEEE International On-Line Testing 50 and Robust System Design Symposium (IOLTS), an established IEEE symposium which has focused for more than two decades on the challenges and solutions for electronic circuits and systems robust design. Held for its first 21 years as the IEEE International On-Line Testing Symposium, it was recently renamed to the International On-Line Testing and Robust Systems Design Symposium, keeping its well-recognized acronym IOLTS; it continues a healthy history with its quarter-century (25th) edition planned for July 2019.