Future and Emergent Materials and Devices for Resistive Switching

During the last years, Resistive Random-Access Memories (ReRAMs or RRAMs) stimulated growing attention as promising non-volatile (NV) candidate memories to surpass existing storage devices while exhibiting excellent performance, reliability and low-energy operation and in the same time be utilized for unconventional computing paradigms such as neuromorphic and in-memory computation. In this paper, a brief review on the current state of the art for RRAMs is provided mainly focusing on the resistance switching mechanisms for various materials and corresponding devices. More specifically, we report on the switching mechanisms of RRAMs considering resistance bi-stability due to phase transformation, interfacial resistive switching, conductive filaments and thermochemical effects while the effect of environmental conditions like moisture and temperature is also analyzed. Finally, preliminary results related to our on-going investigations on such a type of Metal-Insulator-Metal (MIM) RRAMs devices derived from Silicon Nitride and compatible with existing CMOS technology are presented and further discussed.