Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison

We first assess Scanning Thermal Microscopy (SThM) with a self-heated doped silicon nanoprobe as a method for the simultaneous identification of the local thermal conductivity and phase transition temperature of polymeric materials. In a second step, results of an inter laboratory comparison and an uncertainty analysis involving three laboratories applying the same protocol of phase transition temperature measurement allow evaluating the repeatability, the reproducibility and the reliability of the method.