Simplified Procedures for COTS TID Testing: A Comparison Between 90Sr and 60Co

The tolerance to the cumulative effects of ionizing radiation is one of the most important parameters to keep into account when selecting an EEE component for space applications. TID sensitivity is normally investigated measuring changes induced by gamma rays from ⁶⁰Co sources to nominal parameters of a component or to its expected functional behavior. In this work we propose an on-chip ⁹⁰Sr/⁹⁰Y electron source as an alternative methodology for TID tests.⁶⁰Co and ⁹⁰Sr/⁹⁰Y TID test setups for a complex SoC are compared in terms of complexity and of experimental results, investigating the use of a ⁹⁰Sr/⁹⁰Y as well as the established ⁶⁰Co. We show that ⁹⁰Sr allows a simpler test setup, manages to reproduce specific modes of failure obtained with ⁶⁰Co and causes failures at comparable total doses. This makes ⁹⁰Sr an interesting alternative to ⁶⁰Co qualification and the use of untested components, to be further investigated especially for complex COTS SoCs.