TID Evaluation System With On-Chip Electron Source and Programmable Sensing Mechanisms on FPGA

Commercial-off-the-shelf system-on-chip field-programmable gate arrays (FPGAs) are gaining momentum in space applications and their radiation characterization becomes crucial. This paper targets a cost-effective test setup and procedures for total ionization dose testing of miniaturized complex devices. We combine hardware and software techniques to perform on-chip irradiation via a
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Sr/
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Y electron source and assess in detail the degradation of complex SRAM FPGAs. Our methodology combines multiple sensing mechanisms with correlation analysis to facilitate modeling of effects and tuning of a custom ring-oscillator network for future autonomous in-flight use. Focusing on 28-nm Zynq7000 devices, our results show Mrad total ionizing dose tolerance with parameters’ degradation in the area of 5%, zero functional errors, and nonuniform spatial response.