A Dynamic Time Evolution Method for Concurrent Device-Circuit Aging Simulations

A dynamic time evolution method is developed in this paper to implement concurrent device-circuit aging simulations. The dynamic stress on each device during operations is processed by an equivalent stress duration concept, which transfers a continuous-time-based reliability model to its incremental version. With it, the device aging parameters such as threshold voltages are calculated by implementing a given reliability equation inside a compact model. The method is implemented into an open source circuit simulator for function verifications. Aging feedback, which slows down the further aging, is naturally included. Circuit aging simulations show that an overestimation of 32% can be avoided compared to those without considering the aging feedback.