Statistical Approach to Analyze Duty Cycle Jitter Amplification in NAND Flash Memory System

Jitter is amplified in any lossy system due to the channel loss. The amplification occurs at any jitter frequency below Nyquist. Jitter amplification grows exponentially with jitter frequency and data rate. Due to the complexity and lossy system behavior in NAND Flash memory system, duty cycle distortion (DCD) jitter exhibits a unique trend of jitter amplification. Jitter degrades the performance of NAND Flash memory system by limiting the maximum achievable data rates. It is extremely important to accurately apply the jitter in input stimulus while analyzing the system performance to capture the amplification effect. This paper focuses on the importance of DCD jitter analysis in higher-speed and heavier-loading NAND systems, and introduces a statistical approach to DCD jitter analysis.