A technique for the characterization of multi-terminal capacitors for high frequency applications

This paper discusses the characterization of multi-terminal capacitors through a range of frequencies that have a known importance to leading microprocessor technologies. This will cover the measurement of the capacitor by itself, and the de-embedding and analysis of the component to ensure the data only contains the part being measured and not the system on which it is measured, as well as the capacitor in a system. In addition, the techniques discussed for the system mounted capacitor will be supported with modeling.