Characterization and Investigation of Infrared Sensitivity of Reduced Graphene Oxide Films

In this paper, infrared sensitive thin films based on chemically reduced graphene oxide were studied as function of reductions time and reduction temperature. The graphene oxide dispersion was deposited on the flexible substrate by drop casting. The reduction of graphene oxide was achieved by hydroiodic acid at different reduction times and temperatures. These reduced graphene oxide films were characterized by UV-Vis spectroscopy, scanning electron microscopy to study the optical and morphology properties. The UV-Vis spectroscopy spectra shows that by increasing the reduction time more C=O bonds are broken and the band gap can be tuned by changing reduction time. SEM images confirm the reduction process. IR sensitivity of these films were carried out with 980 nm laser illumination at room temperature. The highest sensitivity of 7% at laser illumination of 3.1mW/mm² was found for the reduction time of 2 minutes.