Total Internal Reflection Geometry for Sensitive THz Material Characterization

We proposed and experimentally demonstrated a sensitive THz material characterization method by exploiting thin-film total internal reflection geometry, which performed high sensitivity in characterizing conductive materials, e.g. graphene and PEDOT:PSS, and non-conductive materials, e.g. α-lactose. Our method can be developed into a high sensitive and low sample consumption technique for THz material characterization and spectroscopy in the future.