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MBE-Grown --Ga2O3-Based Schottky UV-C Photodetectors With Rectification Ratio ~107 | IEEE Journals & Magazine | IEEE Xplore

MBE-Grown \beta -Ga2O3-Based Schottky UV-C Photodetectors With Rectification Ratio ~107


Abstract:

In this letter, we demonstrate high-performance vertical solar-blind Schottky photodetectors on MBE-grown homoepitaxial (010)-oriented β-Ga2O3 films. The structure, consi...Show More

Abstract:

In this letter, we demonstrate high-performance vertical solar-blind Schottky photodetectors on MBE-grown homoepitaxial (010)-oriented β-Ga2O3 films. The structure, consisting of (100 nm) β-Ga2O3/(60 nm) n++ β-Ga2O3, was grown on a Fe-doped insulating (010) β-Ga2O3 substrate. Ni/Au and indium were used as the Schottky and Ohmic contacts, respectively. The devices exhibited a rectification ratio of ~107 with turn-on voltage ~1 V and an ideality factor of 1.31. The extracted Schottky barrier height was 1.4 eV. The photodetectors showed low dark current of 0.3 nA at 5 V with a photo-to-dark current ratio of ~102 at 0 V. The devices exhibited a zero-bias responsivity of 4 mA/W at 254 nm corresponding to an external quantum efficiency ~3 %, with a UV-to-visible rejection ratio >103, showing true solar-blind operation. The transient response of the devices indicated rise/fall times of ~100 ms. Temperature-dependent current-voltage characteristics agree with the thermionic emission model.
Published in: IEEE Photonics Technology Letters ( Volume: 30, Issue: 23, 01 December 2018)
Page(s): 2025 - 2028
Date of Publication: 09 October 2018

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